ALTER – Scanning Acoustic Microscopy (C-SAM)
Scanning Acoustic Microscopy (C-SAM) Electron Microscopy for Ensuring the Integrity of Critical Devices In high-reliability industries such as aerospace, automotive, and aviation, ensuring the structural integrity of electronic components is essential for safe and reliable operation. Interfacial defects such as delamination may significantly compromise device performance and long-term reliability if not properly detected and characterised.…
Read more




