Test Method Standard, Microcircuits
This standard establishes uniform methods, controls, and procedures for Testing Microelectronic devices suitable for use within Military and Aerospace electronic systems including basic environmental tests to determine resistance to deleterious effects of natural elements and conditions surrounding military and space operations; mechanical and electrical tests; workmanship and training procedures necessary to ensure a uniform level of quality and reliability suitable to the intended applications of devices as Monolithic, Multichip, Film and Hybrid Microcircuits, Microcircuit arrays, and the elements from which the circuits and arrays are formed. This standard is intended to apply only to Microelectronic devices.
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